Publications of Martijn Hendriks

Also see my entry in the Trier DBLP database.

Pareto Analysis wih Uncertainty

M. Hendriks, M. Geilen, T. Basten. International Conference on Embedded and Ubiquitous Computing (EUC 2011). Melbourne, Australia, October 2011. IEEE Computer Society Press, Los Alamitos, CA, USA, 2011.

Integrated Model-Driven Design-Space Exploration for Embedded Systems

N. Trcka, M. Hendriks, T. Basten, M. Geilen, L. Somers. In International Conference on Embedded Computer Systems: Architectures, Modeling, and Simulation, SAMOS XI, Proceedings, pages xyz-xyz. Samos, Greece, 18-21 July 2011. IEEE Computer Society Press, Los Alamitos, CA, USA, 2011. (pdf)© IEEE.

Model-Driven Design-Space Exploration for Embedded Systems: The Octopus Toolset

T. Basten et al. In T. Margaria and B. Steffen, editors, 4th International Symposium on Leveraging Applications of Formal Methods, Verification and Validation, ISoLA 2010, Proceedings, Part I, pages 90-105. Heraclion, Crete, 18-20 October 2010. Lecture Notes in Computer Science 6415. Springer, Heidelberg, Germany, 2010.

Uppaal 4.0

G. Behrmann, A. David, K.G. Larsen, J. Hakansson, P. Pettersson, W. Yi and M. Hendriks.
Invited paper for QEST 2006.

Timed Automata Based Analysis of Embedded System Architectures

M. Hendriks, M. Verhoef.
  • To appear in WPDRTS 06 [ bib, pdf ].
  • Available as technical report ICIS-R06003.
  • The Uppaal model is available here, and here is the description of the complete case study (this paper only considers a architecture A).

Model Checking Timed Automata - Techniques and Applications

M. Hendriks. PhD thesis, Radboud University Nijmegen. Available as pdf here.

Causal Dependencies in Parallel Composition of Stochastic Processes

L. Cheung, M. Hendriks. Available as technical report ICIS-R05020.

Model Checking the Time to Reach Agreement

 M. Hendriks.

Scheduling Lacquer Production by Reachability Analysis - A Case Study

 G. Behrmann, E. Brinksma, M. Hendriks and A. Mader.

Model Checker Aided Design of a Controller for a Wafer Scanner

M. Hendriks, N. J. M. van den Nieuwelaar and F. W. Vaandrager.
  • Accepted for a special issue of STTT [ bib, pdf ].
  • An extended abstract appeared in the proceedings of ISoLA 2004. The slides are available.
  • Available as technical report NIII-R0430, June 2004.
  • The models and some slides

Adding Symmetry Reduction to Uppaal

M. Hendriks and G. Behrmann and K. G. Larsen and P. Niebert and F. W. Vaandrager.

Recognizing Finite Repetitive Scheduling Patterns in Manufacturing Systems

M. Hendriks and N. J. M. van den Nieuwelaar and F. W. Vaandrager. Proceedings of MISTA 2003 [ bib, ps.gz, pdf ]

Exact Acceleration of Real-Time Model Checking

M. Hendriks and K. G. Larsen.

Translating UPPAAL to Not Quite C

M. Hendriks. Technical report CSI-R0108, CSI, University of Nijmegen, March 2001.